A Nondestructive Technique for Local Measurement of Dielectric Loss in Substrates of Integrated Circuits at Microwaves

Author: Duving V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1061-8309

Source: Russian Journal of Nondestructive Testing, Vol.41, Iss.8, 2005-08, pp. : 544-549

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Abstract