Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases

Author: Zhdan V.   Kozlovskii A.   Mozhaev A.   Pilyugin I.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1061-9348

Source: Journal of Analytical Chemistry, Vol.65, Iss.14, 2010-12, pp. : 1532-1536

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