Simulation, modelling and characterisation of quasi-ballistic transport in nanometer sized field effect transistors: from TCAD to atomistic simulation

Author: Roche Stephan   Poiroux Thierry   Lecarval Gilles   Barraud Sylvain   Triozon Francois   Persson Martin   Niquet Yann Michel  

Publisher: Inderscience Publishers

ISSN: 1475-7435

Source: International Journal of Nanotechnology, Vol.7, Iss.4-5, 2010-02, pp. : 348-366

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Abstract