Deep trap characterisation and conduction band offset determination of AI0.48In0.52As/(Ga0.7AI0.3)0.48In0.52As heterostructures

Author: Ducroquet F.   Jacovetti G.   Rezzoug K.   Ababou S.   Guillot G.   Praseuth J. P.   Olivier-Martin F.   Giraudet L.  

Publisher: Maney Publishing

ISSN: 1743-2847

Source: Materials Science and Technology, Vol.13, Iss.11, 1997-11, pp. : 971-973

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Abstract