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Maney Publishing

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X-ray characterisation of InGaAs/AlAs multiple quantum well p–i–n structures

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Epitaxial growth of ultra-thin NbN films on Al_xGa_1−xN buffer-layers

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Control of metamorphic buffer structure and device performance of InxGa1−xAs epitaxial layers fabricated by metal organic chemical vapor deposition

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Characterisation of semiconductor structures by high resolution X-ray diffraction

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