Use of high temperature X-ray diffractometry to study phase transitions and thermal expansion properties in Ti-6Al-4V

Author: Pederson R.   Babushkin O.   Skystedt F.   Warren R.  

Publisher: Maney Publishing

ISSN: 1743-2847

Source: Materials Science and Technology, Vol.19, Iss.11, 2003-11, pp. : 1533-1538

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract