Author： Ahrenkiel R.K. Keyes B.M. Johnston S.
Publisher： Maney Publishing
ISSN： 1743-2944
Source： Surface Engineering, Vol.16, Iss.1, 2000-02, pp. : 54-60
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Parente P. Ferro G. Tucci A. Esposito L. Timellini G.
International Journal of Materials and Product Technology, Vol. 35, Iss. 3-4, 2009-05 ,pp. :
Access to resources
Recommend
By Borowik Ł Lepage H Chevalier N Mariolle D Renault O
Nanotechnology, Vol. 25, Iss. 26, 2014-07 ,pp. :
Dislocations in semiconductors
By Hirsch P. B.
Materials Science and Technology, Vol. 1, Iss. 9, 1985-09 ,pp. :