ANALYSIS OF XRD STRESS MEASUREMENT DATA OF NATURALLY GROWN OXIDE FILMS Al₂O₃ AND Cr₂O₃ BASED ON EXISTING REUSS, VOIGT, AND HILL MODELS

Author： Sarioglu C.

Publisher： Maney Publishing

ISSN： 1743-2944

Source： Surface Engineering, Vol.18, Iss.2, 2002-04, pp. : 105-111

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