Quantitative characterisation of damage mechanisms in ancient ceramics by quantitative X-ray powder diffraction, polarisation microscopy, confocal laser scanning microscopy and non-contact mode atomic force microscopy

Author： Emami S. M. A.   Volkmar J.   Trettin R.  

Publisher： Maney Publishing

ISSN： 1743-2944

Source： Surface Engineering, Vol.24, Iss.2, 2008-03, pp. : 129-137

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Quantitative sub-surface and non-contact imaging using scanning microwave microscopy

By  

Nanotechnology, Vol. 26, Iss. 13, 2015-03 ,pp. : 135701-135709

IOP Publishing

Access to resources Recommend Favorite

Subsurface damage measurement in silicon wafers with cross-polarisation confocal microscopy

By Lu W.K.   Sun J.G.   Pei Z.J.  

International Journal of Nanomanufacturing, Vol. 1, Iss. 2, 2007-01 ,pp. : 272-282

Inderscience Publishers

Access to resources Recommend Favorite

Multimodal microscopy using ‘half and half’ contact mode and ultrasonic force microscopy

By Skilbeck M S   Marsden A J   Cao G   Kinloch I A   Young R J   Edwards R S   Wilson N R  

Nanotechnology, Vol. 25, Iss. 33, 2014-08 ,pp. : 335708-335715

IOP Publishing

Access to resources Recommend Favorite

Intermittent contact resonance atomic force microscopy

By Stan Gheorghe   Gates Richard S  

Nanotechnology, Vol. 25, Iss. 24, 2014-06 ,pp. : 245702-245709

IOP Publishing

Access to resources Recommend Favorite

Atomic force microscopy of scratch damage in polypropylene

By Dasari A.   Duncan S. J.   Misra R. D. K.  

Materials Science and Technology, Vol. 18, Iss. 10, 2002-10 ,pp. : 1227-1234

Maney Publishing

Access to resources Recommend Favorite