Author： Eigenmann B. Scholtes B. Macherauch E.
Publisher： Maney Publishing
ISSN： 1743-2944
Source： Surface Engineering, Vol.7, Iss.3, 1991-01, pp. : 221-224
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Abstract
A method is presented to separate, for the purpose of residual stress analysis, superimposed X-ray diffraction patterns arising from thin surface layers and substrates with similar crystal structures or from multilayer coatings in which the individual layers are of similar structure. The method is also suitable for use on bulk materials in which the stress gradient is very steep. Residual stress determinations were carried out in single and multilayer electrodeposited chromium coatings on steel. In the single coating the maximum residual stress was found to exist in the centre of the coating, whereas in the three layered coating the maximum values were found close to the substrate.
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