Effects of Rework on the Reliability of Pin Grid Array Interconnects

Author： Lau J.   Leung S.   Subrahmanyan R.   Rice D.   Erasmus S.   Li C.Y.  

Publisher： Emerald Group Publishing Ltd

ISSN： 0305-6120

Source： Circuit World, Vol.17, Iss.4, 1993-12, pp. : 5-10

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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