Author： Gao Weiwei Sun Xuan Shen Baogen Sun Jirong
Publisher： IOP Publishing
ISSN： 0022-3727
Source： Journal of Physics D: Applied Physics, Vol.44, Iss.2, 2011-01, pp. : 25002-25006
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Abstract
We performed a systematic study on a Cu/La0.67Ba0.33MnO3/SrTiO3 : Nb (Cu/LBMO/STON) junction with a manganite layer, a few unit cells in width, focusing on the evolution of Cu–STON coupling as the film thickness of LBMO grew. The physical properties of the junction are found to be jointly determined by the electrode, the film and the substrate when the film thickness of LBMO is below ~1 nm, with a carrier tunnelling process and a weakly rectifying feature. A LBMO film above ~1 nm completely screens the electrode–substrate interaction, enhancing the rectifying character of the junctions significantly. A further increase in film thickness leads only to a minor modification of the junctions.
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