International comparison of roundness profiles with nanometric accuracy

Author: Haitjema H.   Bosse H.   Frennberg M.   Sacconi A.   Thalmann R.  

Publisher: IOP Publishing

ISSN: 0026-1394

Source: Metrologia, Vol.33, Iss.1, 1996-01, pp. : 67-73

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Abstract