NPL-CSIC comparison of regular reflectance measurements

Author: Campos J.   Fontecha J. L.   Pons A.   Hanson A.   Williams D.   Verrill J.  

Publisher: IOP Publishing

ISSN: 0026-1394

Source: Metrologia, Vol.37, Iss.4, 2000-10, pp. : 323-327

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Abstract