

Author: Kaplan S. G. Hanssen L. M. Early E. A. Nadal M. E. Allen D.
Publisher: IOP Publishing
ISSN: 0026-1394
Source: Metrologia, Vol.39, Iss.2, 2002-04, pp. : 157-164
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
A spectrophotometer based on an integrating sphere coupled to a commercial Fourier Transform Infrared (FTIR) instrument has been constructed for regular spectral transmittance and reflectance measurements over the 1 μm to 18 μm wavelength region. Despite the large number of sources of error that often limit the radiometric accuracy of FTIR measurements, we demonstrate uncertainties similar to established dispersive instrumentation. We performed near-normal-incidence reflectance and transmittance measurements on a series of samples over the 1 μm to 2.5 μm wavelength range using both FTIR and dispersive spectrophotometers. The results are compared, taking into account any differences in measurement geometry among the various systems and the combined measurement uncertainty. We find agreement within the combined uncertainties over most of the measured spectral region.
Related content






NPL-CSIC comparison of regular reflectance measurements
By Campos J. Fontecha J. L. Pons A. Hanson A. Williams D. Verrill J.
Metrologia, Vol. 37, Iss. 4, 2000-10 ,pp. :


By Corredera P. Campos J. Hernanz M. L. Fontecha J. L. Pons A. Corrons A.
Metrologia, Vol. 35, Iss. 4, 1998-08 ,pp. :


Automatic Modeling of (Cross) Covariance Tables Using Fast Fourier Transform
By Yao T.
Mathematical Geology, Vol. 30, Iss. 6, 1998-08 ,pp. :