Author: Stock E Unrau W Lochmann A Töfflinger J A Öztürk M Toropov A I Bakarov A K Haisler V A Bimberg D
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.26, Iss.1, 2011-01, pp. : 14003-14006
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Abstract
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