Author: Mujagić E Schwarzer C Schrenk W Chen J Gmachl C Strasser G
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.26, Iss.1, 2011-01, pp. : 14019-14024
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Sirbu Alexei Iakovelv Vladimir Caliman Andrei Kapon Eli Mereuta Alexandru Suruceanu Grigore
Semiconductor Science and Technology, Vol. 26, Iss. 1, 2011-01 ,pp. :
Reliability performance of 25 Gbit s −1 850 nm vertical-cavity surface-emitting lasers
By Karachinsky L Ya Blokhin S.A. Novikov I.I. Maleev N.A. Kuzmenkov A.G. Bobrov M.A. Lott J.A. Ledentsov N.N. Shchukin V.A. Kropp J-R Bimberg D.
Semiconductor Science and Technology, Vol. 28, Iss. 6, 2013-06 ,pp. :