Author: Wang X Erbert G Wenzel H Eppich B Crump P Ginolas A Fricke J Bugge F Spreemann M Tränkle G
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.27, Iss.1, 2012-01, pp. : 15010-15019
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Abstract
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