Author： Jönen H Bremers H Rossow U Langer T Kruse A Hoffmann L Thalmair J Zweck J Schwaiger S Scholz F Hangleiter A
Publisher： IOP Publishing
ISSN： 0268-1242
Source： Semiconductor Science and Technology, Vol.27, Iss.2, 2012-02, pp. : 24013-24020
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