A comparative experimental study on sample excitation and probe excitation in force modulation atomic force microscopy

Author: Yang Chunlai   Wang Tian   Huang Wenhao   Chen Yuhang  

Publisher: IOP Publishing

ISSN: 0957-0233

Source: Measurement Science and Technology, Vol.24, Iss.2, 2013-02, pp. : 25403-25408

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Abstract