Automated pinhole-aperture diagnostic for the current profiling of TWT electron beams

Author： Wei Yu-Xiang   Huang Ming-Guang   Liu Shu-Qing   Liu Jin-Yue   Hao Bao-Liang   Du Chao-Hai   Liu Pu-Kun  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.24, Iss.2, 2013-02, pp. : 25901-25907

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