Unveiling the Composition of Sulfur Sensitization Specks by their Interaction with TAI

Author： Charlier E. Van Doorselaer M. Gijbels R. De Keyzer R. Geuens I.

Publisher： Society for Imaging Science and Technology

ISSN： 1943-3522

Source： Journal of Imaging Science and Technology, Vol.44, Iss.3, 2000-05, pp. : 235-241

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