Can You See What Others See –A Defect Detection Model for Patterned Backgrounds

Author： Wei Guo-Feng Luo M. Ronnier Rhodes Peter A.

Publisher： Society for Imaging Science and Technology

ISSN： 2158-6330

Source： Conference on Colour in Graphics, Imaging, and Vision, Vol.2012, Iss.1, 2012-01, pp. : 108-114

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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