ICC Profile Based Defect Simulation

Author: Tastl Ingeborg   Koh Kok-Wei   Moroney Nathan   Rossing David   Berfanger David  

Publisher: Society for Imaging Science and Technology

ISSN: 2166-9635

Source: Color and Imaging Conference, Vol.2006, Iss.1, 2006-01, pp. : 230-233

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract