Application of the controlled deterioration test to evaluate wheat seed vigour

Author: Modarresi R.   Van Damme P.  

Publisher: International Seed Testing Association

ISSN: 1819-5717

Source: Seed Science and Technology, Vol.31, Iss.3, 2003-10, pp. : 771-775

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract