Author: Li X. Liu L. Gong Y. Wang Y. Fu B. Hou X. Zhu X. Yu F. Shen H.
Publisher: International Seed Testing Association
ISSN: 1819-5717
Source: Seed Science and Technology, Vol.36, Iss.2, 2008-07, pp. : 440-446
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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