Author： Hirotani J. Ikuta T. Takahashi K.
Publisher： Springer Publishing Company
ISSN： 0195-928X
Source： International Journal of Thermophysics, Vol.34, Iss.12, 2013-12, pp. : 2351-2360
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Abstract
A carbon nanotube (CNT) has a very high intrinsic thermal conductivity and is expected to be used in a variety of thermal applications. However, the thermal contact resistance (TCR) between a CNT and ambient material still remains unclear. Some analytical and molecular dynamics studies have been reported, but there is no reliable experimental method to quantitatively investigate the interface issues. This article reports on a new technique for measuring the TCR at the end of an individual CNT by using a platinum hot film sensor. Two methods are introduced to obtain the TCR between a multi-walled CNT and a SiO2 surface, and both methods were confirmed to give an identical TCR.
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