Statistical process monitoring approach for high-density point clouds

Author: Wells Lee   Megahed Fadel   Niziolek Cory   Camelio Jaime   Woodall William  

Publisher: Springer Publishing Company

ISSN: 0956-5515

Source: Journal of Intelligent Manufacturing, Vol.24, Iss.6, 2013-12, pp. : 1267-1279

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Abstract