Impedance spectroscopy study of anodic growth of thick zirconium oxide films in H2SO4, Na2SO4 and NaOH solutions

Author： PAUPORTÉ THIERRY   FINNE JÖRGEN  

Publisher： Springer Publishing Company

ISSN： 0021-891X

Source： Journal of Applied Electrochemistry, Vol.36, Iss.1, 2006-01, pp. : 33-41

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Abstract

Anodic zirconium oxide films were grown potentiodynamically at a constant sweep rate up to the breakdown potential on rod electrodes made of 99.8% metallic zirconium. Different media of different pH were tested, namely 0.5 M H2SO4 (pH 0.3), 0.1 M Na2SO4 (pH 9) and 0.1 M NaOH (pH 13). By electrochemical impedance spectroscopy and scanning electron microscopy the oxide film thickness was monitored during the voltage scan. The behaviour was found to be different in the presence and absence of sulphate anions. In the presence of SO 42− , the films were dense but breakdown occurred at 300–340 nm. In NaOH, two relaxations appeared above 50 V and were ascribed to a bi-layered coating structure and the maximum layer thickness was 720 nm before breakdown.

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