Properties of the GaAs–Si Interface in Epitaxy through an Aluminum Layer

Author： Katsapov F.M.   Lakoza L.V.   Tyavlovskaya E.A.  

Publisher： Springer Publishing Company

ISSN： 0021-9037

Source： Journal of Applied Spectroscopy, Vol.67, Iss.6, 2000-11, pp. : 1050-1053

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