Accuracy of Determining the Optical Parameters of Thin Films by the Method of the Reflectance-Spectrum Extrema Envelopes

Author： Filippov V.V. Kutavichyus V.P.

Publisher： Springer Publishing Company

ISSN： 0021-9037

Source： Journal of Applied Spectroscopy, Vol.70, Iss.1, 2003-01, pp. : 122-129

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