Method for measuring integrated sensitivity of solar cells and multielement photoconverters using an X-Y scanner

Author： Naumov V.   Grebenshchikov O.   Zalesskii V.  

Publisher： Springer Publishing Company

ISSN： 0021-9037

Source： Journal of Applied Spectroscopy, Vol.73, Iss.5, 2006-09, pp. : 753-759

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