Imaging of a Suspended Helium Film with 2-D Electrons by Interferometry

Author: Valkering A.M.C.   Klier J.   Teske E.   van der Heijden R.W.   Leiderer P.  

Publisher: Springer Publishing Company

ISSN: 0022-2291

Source: Journal of Low Temperature Physics, Vol.113, Iss.5-6, 1998-12, pp. : 1115-1120

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Abstract