Imaging the edge of a 4He prewetting film on a cesium metal surface

Author： Müller X.   Kinoshita T.   Dupont-Roc J.  

Publisher： Springer Publishing Company

ISSN： 0022-2291

Source： Journal of Low Temperature Physics, Vol.113, Iss.5-6, 1998-12, pp. : 823-828

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Abstract

The edge of a metastable 4He prewetting film on a cesium metal surface is investigated using polarization interference microscopy. This technique images the local gradient of the coverage through its optical thickness. The cesium metal is a film evaporated on a polished copper substrate. A liquid helium film is deposited on the surface through raising and lowering the bulk liquid surface. Its edge is clearly observed for temperatures below 1.6 K. The apparent optical thicknesses of the films, larger than what is expected for a normal saturated film, remain to be explained.

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