Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices

Author: Eichenberger A.L.   Keller M.W.   Martinis J.M.   Zimmerman N.M.  

Publisher: Springer Publishing Company

ISSN: 0022-2291

Source: Journal of Low Temperature Physics, Vol.118, Iss.5-6, 2000-03, pp. : 317-324

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Abstract