

Author: Saitoh M. Ikegami H. Mukuda H. Kono K.
Publisher: Springer Publishing Company
ISSN: 0022-2291
Source: Journal of Low Temperature Physics, Vol.134, Iss.1-2, 2004-01, pp. : 357-362
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Abstract
We report the measurements of the critical current of superfluid 3He film for the thickness of 0.47 µm. By employing inter-digitated capacitors, 2.5×10−2 mm33He can be manipulated with 0.4% resolution. Critical current
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