

Author: Garcia R. Jordan S. Lazzaretti J. Chan M. H. W.
Publisher: Springer Publishing Company
ISSN: 0022-2291
Source: Journal of Low Temperature Physics, Vol.134, Iss.1-2, 2004-01, pp. : 527-533
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Abstract
We present the results of a quartz microbalance measurement of a ∼440 Å thick 4He film adsorbed on Au. This measurement confirms the result of an earlier capacitance measurement that showed a dip in the film thickness just below Ta due to the critical Casimir force. The magnitude of the dip in the two measurements agrees within 15% . In addition to the dip, we see a signal due to the onset of superfluidity in the film. An apparent peak in the film thickness, not observed previously, is also found coinciding closely with the bulk
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