Author： Klier J. Zech M. Fubel A. Leiderer P. Shikin V.
Publisher： Springer Publishing Company
ISSN： 0022-2291
Source： Journal of Low Temperature Physics, Vol.138, Iss.1-2, 2005-01, pp. : 355-360
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Texture and surface roughness of PRCVD aluminum films
By Yang D. Jonnalagadda R. Rogers B.R. Hillman J.T. Foster R.F. Cale T.S.
Thin Solid Films, Vol. 332, Iss. 1, 1998-11 ,pp. :
Access to resources
Recommend
