Optical and structural characterization of r.f. sputtered CeO2 thin films

Author: Bueno R.M.   Martinez-Duart J.M.   Hernandez-Velez M.   Vazquez L.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.32, Iss.7, 1997-07, pp. : 1861-1865

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Abstract