Growth and physicochemical characterization of CuAlTe2 films obtained by reaction, induced by annealing, between Cu/Al/Te/Al/Cu... Al/Cu/Al/Te layers sequentially deposited

Author： Benchouk K.   El Moctar C.   Bernede J.   Marsillac S.   Pouzet J.   Barreau N.   Emziane M.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.34, Iss.8, 1999-04, pp. : 1847-1853

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