High resolution microscopy study in Cr3C2-doped WC-Co

Author: Yamamoto T.   Ikuhara Y.   Watanabe T.   Sakuma T.   Taniuchi Y.   Okada K.   Tanase T.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.36, Iss.16, 2001-08, pp. : 3885-3890

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Abstract