Author: Feng D. Tan H. van Deventer J. S. J.
Publisher: Springer Publishing Company
ISSN: 0022-2461
Source: Journal of Materials Science, Vol.39, Iss.2, 2004-01, pp. : 571-580
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Materials Today, Vol. 6, Iss. 7, 2003-07 ,pp. :
Enhanced radiography for aircraft materials and components
By Thornton J.
Engineering Failure Analysis, Vol. 11, Iss. 2, 2004-04 ,pp. :