Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

Author： Müller F.   Müller A.-D.   Schulze S.   Hietschold M.  

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.39, Iss.9, 2004-05, pp. : 3199-3200

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