Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.40, Iss.18, 2005-09, pp. : 5033-5036

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Electrochemical growth and characterization of manganese telluride thin films

By Sharma R.K. Rastogi A.C. Singh G.

Materials Chemistry and Physics, Vol. 84, Iss. 1, 2004-03 ,pp. : 46-51

Elsevier

Access to resources Recommend Favorite

Monte Carlo study of quantitative analysis method of trace elements in thin aluminum films

By Osada Y.

Journal of Materials Science, Vol. 40, Iss. 3, 2005-02 ,pp. : 693-700

Springer Publishing Company

Access to resources Recommend Favorite

Growth, electrical and structural characterization of β-GaSe thin films

By Parlak M. Qasrawi A.F.

Journal of Materials Science, Vol. 38, Iss. 7, 2003-04 ,pp. : 1507-1511

Springer Publishing Company

Access to resources Recommend Favorite

Growth of highly c-axis oriented aluminum nitride thin films on β-tantalum bottom electrodes

By Akiyama M. Ueno N. Nagao K. Yamada T.

Journal of Materials Science, Vol. 41, Iss. 14, 2006-07 ,pp. : 4691-4694

Springer Publishing Company

Access to resources Recommend Favorite

Morphological Characterization of Fabricated Aluminum Interdigitated Electrodes on Silicon Substrate

Advanced Materials Research, Vol. 2015, Iss. 1109, 2015-07 ,pp. : 381-384

Trans Tech Publications

Access to resources Recommend Favorite