In-situ high temperature X-ray diffraction study of Co/SiC interface reactions

By Fujimura T.    

Journal of Materials Science, Vol. 34, Iss. 23, 1999-12 ,pp. : 5743-5747

Springer Publishing Company

Access to resources Recommend Favorite

In-situ high temperature X-ray diffraction study of Fe/Al2O3 interface reactions

By Fujimura T.    

Journal of Materials Science, Vol. 34, Iss. 3, 1999-02 ,pp. : 425-429

Springer Publishing Company

Access to resources Recommend Favorite

Grain size measurement of nanocrystalline gold by x-ray diffraction method

By Inami T.   Kobiyama M.   Okuda S.   Maeta H.   Ohtsuka H.  

Nanostructured Materials, Vol. 12, Iss. 5, 1999-01 ,pp. : 657-660

Elsevier

Access to resources Recommend Favorite

Micro-Raman spectroscopy and X-ray diffraction studies of atomic-layer-deposited ZrO₂ and HfO₂ thin films

By Tkachev S.   Manghnani M.   Niilisk A.   Aarik J.   Mändar H.  

Journal of Materials Science, Vol. 40, Iss. 16, 2005-08 ,pp. : 4293-4298

Springer Publishing Company

Access to resources Recommend Favorite

Direct measurement of the kinetics of geopolymerisation by in-situ energy dispersive X-ray diffractometry

By Provis John   Deventer Jannie  

Journal of Materials Science, Vol. 42, Iss. 9, 2007-05 ,pp. : 2974-2981

Springer Publishing Company

Access to resources Recommend Favorite