The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

Author： Smeeton T. Humphreys C. Barnard J. Kappers M.

Publisher： Springer Publishing Company

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.41, Iss.9, 2006-05, pp. : 2729-2737

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