X-ray diffraction investigation of siloxanes. II. Dependence of the structure of cyclic trisiloxanes on the nature of organic substituents at the silicon atom

Author： Malinovskii S.   Tesuro Vallina A.   Stoeckli-Evans H.  

Publisher： Springer Publishing Company

ISSN： 0022-4766

Source： Journal of Structural Chemistry, Vol.47, Iss.6, 2006-11, pp. : 1134-1140

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