Author: Bykov Yu. A. Karpukhin S. D. Panfilov Yu. V. Boichenko M. K. Cheptsov V. O. Osipov A. V.
Publisher: Springer Publishing Company
ISSN: 0026-0673
Source: Metal Science and Heat Treatment, Vol.45, Iss.9-10, 2003-09, pp. : 396-399
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Measurement on the Mechanical Properties of SiC Thin Films Based on Square Thin Films Theory
Key Engineering Materials, Vol. 2015, Iss. 645, 2015-06 ,pp. :
Edge-to-edge matching in thin films
Metallurgical and Materials Transactions A, Vol. 37, Iss. 12, 2006-03 ,pp. :