Refracted X-Ray Fluorescence (RXF) Applied to the Study of Thin Films and Thermally-Grown Oxide Scales

Author： Koshelev I.   Paulikas A.P.   Veal B.W.  

Publisher： Springer Publishing Company

ISSN： 0030-770X

Source： Oxidation of Metals, Vol.51, Iss.1-2, 1999-02, pp. : 23-54

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