Bibliometric laws: Empirical flaws of fit

Author: Bailón-Moreno R.   Jurado-Alameda E.   Ruiz-Baños R.   Courtial J. P.  

Publisher: Springer Publishing Company

ISSN: 0138-9130

Source: Scientometrics, Vol.63, Iss.2, 2005-04, pp. : 209-229

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Abstract